Amorphous Films at Metal/Ceramic Interfaces

Abstract The interface chemistry and structure of two metal/ceramic composites was investigated using analytical and high-resolution transmission electron microscopy. Cu and Ni alumina composites were prepared and doped with predetermined amounts of Ca and Si additions to obtain a glass phase during sintering. The Si and Ca additions resulted in the formation of glass pockets at triple junctions and intergranular films at the alumina grain boundaries and the metal/alumina interfaces. A variation in the thickness and chemistry of the film at the metal/alumina interface was observed between the two composites. The formation of intergranular films and their presence at metal/alumina interfaces of occluded particles indicate that the intergranular films are probably stable.