扫描透射电子显微镜
纳米技术
电子能量损失谱
高分辨率
高分辨率透射电子显微镜
直接成像
暗场显微术
材料科学
化学
透射电子显微镜
物理
显微镜
光学
遥感
地质学
作者
Karl Sohlberg,Timothy J. Pennycook,Wu Zhou,Stephen J. Pennycook
摘要
The observation that, "New tools lead to new science"[P. S. Weiss, ACS Nano., 2012, 6(3), 1877-1879], is perhaps nowhere more evident than in scanning transmission electron microscopy (STEM). Advances in STEM have endowed this technique with several powerful and complimentary capabilities. For example, the application of high-angle annular dark-field imaging has made possible real-space imaging at sub-angstrom resolution with Z-contrast (Z = atomic number). Further advances have wrought: simultaneous real-space imaging and elemental identification by using electron energy loss spectroscopy (EELS); 3-dimensional (3D) mapping by depth sectioning; monitoring of surface diffusion by time-sequencing of images; reduced electron energy imaging for probing graphenes; etc. In this paper we review how these advances, often coupled with first-principles theory, have led to interesting and important new insights into the physical chemistry of materials. We then review in detail a few specific applications that highlight some of these STEM capabilities.
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