光致发光
钝化
材料科学
光电探测器
光电子学
光探测
载流子寿命
带隙
宽禁带半导体
半导体
外延
纳米技术
硅
图层(电子)
作者
Félix A. Estévez H.,Morgan Bergthold,Oleg Maksimov,Harish B. Bhandari,Christian P. Morath,Alexander W. Duchane,Preston T. Webster,Daniel Wasserman
摘要
We investigate the bulk passivation of the dilute bismide alloy InAsSbBi by plasma-assisted hydrogenation. InAsSbBi is of significant interest for mid- to long-wave infrared photodetection due to its bandgap flexibility and potential integration with heterostructured photodetector architectures. Epitaxially grown InAsSbBi samples are characterized by photoluminescence and time-resolved photoluminescence measurements for a range of hydrogenation conditions. Increases in the minority carrier lifetime of over 3× are reported, with no degradation over a period of months following the treatment. Photoluminescence measurements confirm that the hydrogenation process improves the InAsSbBi optical properties. These results offer a path toward the improved performance of InAsSbBi-based photodetectors and potentially other narrow bandgap semiconductor materials and material systems.
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