期刊:IEEE Electron Device Letters [Institute of Electrical and Electronics Engineers] 日期:2013-04-12卷期号:34 (5): 584-586被引量:396
标识
DOI:10.1109/led.2013.2253752
摘要
In this letter, a double-gate junctionless tunnel field effect transistor (JL-TFET) is proposed and investigated. The JL-TFET is a Si-channel heavily n-type-doped junctionless field effect transistor (JLFET), which uses two isolated gates (Control-Gate, P-Gate) with two different metal work-functions to behave like a tunnel field effect transistor (TFET). In this structure, the advantages of JLFET and TFET are combined together. The simulation results of JL-TFET with high-k dielectric material (TiO2) of 20-nm gate length shows excellent characteristics with high ION/IOFFratio (~6×108), a point subthreshold slope (SS) of ~38 mV/decade, and an average SS of ~70 mV/decade at room temperature, which indicates that JL-TFET is a promising candidate for a switching performance.