干法蚀刻
材料科学
蚀刻(微加工)
数码产品
等离子体刻蚀
光电子学
热稳定性
纳米技术
光子学
工程物理
化学工程
电气工程
工程类
图层(电子)
作者
S. J. Pearton,R. J. Shul,F. Ren
标识
DOI:10.1557/s1092578300000119
摘要
The characteristics of dry etching of the AlGaInN materials system in different reactor types and plasma chemistries are reviewed, along with the depth and thermal stability of etch-induced damage. The application to device processing for both electronics and photonics is also discussed.
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