分辨率(逻辑)
显微镜
光学
先验与后验
图像分辨率
傅里叶变换
度量(数据仓库)
超分辨显微术
衍射
迭代重建
计算机科学
计算机视觉
材料科学
物理
人工智能
扫描共焦电子显微镜
数据挖掘
哲学
认识论
量子力学
作者
Niccolò Banterle,Khanh Huy Bui,Edward A. Lemke,Martin Beck
标识
DOI:10.1016/j.jsb.2013.05.004
摘要
Optical nanoscopy techniques using localization based image reconstruction, also termed super-resolution microscopy (SRM), have become a standard tool to bypass the diffraction limit in fluorescence light microscopy. The localization precision measured for the detected fluorophores is commonly used to describe the maximal attainable resolution. However, this measure takes not all experimental factors, which impact onto the finally achieved resolution, into account. Several other methods to measure the resolution of super-resolved images were previously suggested, typically relying on intrinsic standards, such as molecular rulers, or on a priori knowledge about the specimen, e.g. its spatial frequency content. Here we show that Fourier ring correlation provides an easy-to-use, laboratory consistent standard for measuring the resolution of SRM images. We provide a freely available software tool that combines resolution measurement with image reconstruction.
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