光刻胶
耐久性
干法蚀刻
材料科学
纳米技术
蚀刻(微加工)
抵抗
光电子学
复合材料
图层(电子)
作者
С. В. Зеленцов,N. V. Zelentsova,A. N. Kolesov,L. A. Bogatyreva,I. A. Mashtakov
标识
DOI:10.1134/s1063739707010052
摘要
A review is presented of the main approaches to the enhancement of photoresist-mask durability under dry etching. The physical and chemical processes involved are described.
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