The MBE grown ZnYbTe layers were characterized by X-ray diffraction, photoluminescence and reflectivity measurements.The MBE growth conditions allowing to obtain monocrystalline ZnYbTe layers were found to be metal-rich (MBE growth with excess of Zn flux).In optical measurements (photoluminescence, reflectivity), both transitions connected with ternary ZnYbTe compound and with Yb3+ ions were detected.The quality of ZnYbTe layers with Yb content of 3% and 1% is inferior to the quality of pure ZnTe MB.E layers, which is clearly seen in the results of photoluminescence and reflectivity measurements.In the ZnYbTe layers with 3% Yb, exhibiting monocrystalline character in reflection high-energy electron diffraction and X-ray diffraction measurements, optical transitions characteristic of pure YbTe were detected.In ZnYbTe layers with 1% Yb, no transítions connected with YbTe were observed.