弯曲分子几何
同步辐射
物理
辐射
光学
曲率
微通道
微通道板探测器
探测器
材料科学
几何学
机械
复合材料
数学
作者
M. I. Mazuritskiy,А. М. Lerer,A. Marcelli,С.Б. Дабагов,Marcello Coreno,A. D’Elia,S.J. Rezvani
标识
DOI:10.1107/s1600577520016458
摘要
Synchrotron radiation sources have been used to study the focusing properties and angular distribution of X-ray radiation at the exit of spherically bent microchannel plates (MCPs). In this contribution it is shown how soft X-ray radiation at energies up to 1.5 keV can be focused by spherically bent MCPs with curvature radii R of 30 mm and 50 mm. For these devices, a focus spot is detectable at a distance between the detector and the MCP of less than R /2, with a maximum focusing efficiency up to 23% of the flux illuminating the MCP. The soft X-ray radiation collected at the exit of microchannels of spherically bent MCPs are analyzed in the framework of a wave approximation. A theoretical model for the wave propagation of radiation through MCPs has been successfully introduced to explain the experimental results. Experimental data and simulations of propagating radiation represent a clear confirmation of the wave channeling phenomenon for the radiation in spherically bent MCPs.
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