Application of single pixel imaging in 3D measurement

Traditional optical 3D shape measurement methods, such as Fringe projection techniques, cannot acquire high-quality and high-accuracy 3D measurement results in the presence of global illumination. Typical global illumination effects contain interreflections and subsurface scattering. Interreflections occur in concave surfaces with glossy reflection, and subsurface scattering occurs in translucent materials. Single-pixel imaging (SI) techniques can capture a scene through a detector with no spatial resolution. However, traditional pixelated imaging sensors are commonly adopted in most modern digital cameras. Here, we extended SI to pixelated imaging sensors, in which every pixel on an imaging sensor was considered an independent unit that can simultaneously obtain an image. Our experiments show that the SI can completely decompose direct and global illumination. Furthermore, high-quality and high-accuracy 3D profile in the presence of global illumination can be reconstructed.