材料科学
光电探测器
贵金属
光探测
光电子学
电子迁移率
纳米电子学
带隙
场效应晶体管
红外线的
数码产品
晶体管
金属
纳米技术
光学
电气工程
冶金
物理
电压
工程类
作者
Zhen Wang,Peng Wang,Fang Wang,Jiafu Ye,Ting He,Feng Wu,Meng Peng,Peisong Wu,Yunfeng Chen,Fang Zhong,Runzhang Xie,Zhuangzhuang Cui,Liang Shen,Qinghua Zhang,Lin Gu,Man Luo,Yang Wang,Huawei Chen,Peng Zhou,Anlian Pan,Xiaohao Zhou,Lili Zhang,Weida Hu
标识
DOI:10.1002/adfm.201907945
摘要
Abstract 2D layered materials are an emerging class of low‐dimensional materials with unique physical and structural properties and extensive applications from novel nanoelectronics to multifunctional optoelectronics. However, the widely investigated 2D materials are strongly limited in high‐performance electronics and ultrabroadband photodetectors by their intrinsic weaknesses. Exploring the new and narrow bandgap 2D materials is very imminent and fundamental. A narrow‐bandgap noble metal dichalcogenide (PtS 2 ) is demonstrated in this study. The few‐layer PtS 2 field‐effect transistor exhibits excellent electronic mobility exceeding 62.5 cm 2 V −1 s −1 and ultrahigh on/off ratio over 10 6 at room temperature. The temperature‐dependent conductance and mobility of few‐layer PtS 2 transistors show a direct metal‐to‐insulator transition and carrier scattering mechanisms, respectively. Remarkably, 2D PtS 2 photodetectors with broadband photodetection from visible to mid‐infrared and a fast photoresponse time of 175 µs at 830 nm illumination for the first time are obtained at room temperature. Our work opens an avenue for 2D noble‐metal dichalcogenides to be applied in high‐performance electronic and mid‐infrared optoelectronic devices.
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