逐次逼近ADC
无杂散动态范围
最低有效位
有效位数
比较器
电容器
电子工程
计算机科学
CMOS芯片
12位
微分非线性
电气工程
工程类
电压
操作系统
作者
Ji‐Yong Um,Yoon-Jee Kim,Eunwoo Song,Jae‐Yoon Sim,Hong-June Park
出处
期刊:IEEE Transactions on Circuits and Systems I-regular Papers
[Institute of Electrical and Electronics Engineers]
日期:2013-04-15
卷期号:60 (11): 2845-2856
被引量:103
标识
DOI:10.1109/tcsi.2013.2252475
摘要
A digital-domain calibration method is proposed for a split-capacitor DAC (split-CDAC) used in a differential-type 11-bit SAR ADC. It calibrates the nonlinearities of SAR ADC due to the DAC capacitance mismatch as well as the two parasitic capacitances connected in parallel with each of the bridge capacitor and the LSB bank of split-CDAC. The proposed ADC does not require any additional analog circuits for calibration, because it utilizes one of the two split-CDACs to measure the error codes of the other split-CDAC. During the normal A/D conversion step, the 11.5-bit raw SAR code output of ADC is added to the pre-measured error codes to generate the 11-bit calibrated output code. The analog block of the ADC was fabricated in a 0.13- μm CMOS process, and the digital block was implemented in a FPGA. The measured SNDR and SFDR are 61.6 dB (ENOB 9.93 bits) and 78 dB at the Nyquist rate with a 5 kHz sine wave input. INL and DNL are measured to be +0.96/-0.98 LSB, and +0.96/-0.97 LSB, respectively. This work extends the prior work by utilizing an additional 0.5-bit raw SAR code to eliminate the missing code, and by employing a temporal averaging with a FIR LPF to measure the error code reliably in spite of the supply noise.
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