Modeling thermal abuse in transportation batteries
作者
USDOE National Nuclear Security Administration (NNSA),Richard A. Muller,Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States),Randall T. Cygan,Jie Deng,Amalie L. Frischknecht,John Hewson,Michael P. Kanouff,R. L. Larson,Harry K. Moffat,Craig M. Tenney,Peter A. Schultz,Gregory J. Wagner