原子单位
透射电子显微镜
单层
高分辨率透射电子显微镜
分辨率(逻辑)
比例(比率)
计算机科学
算法
电子断层摄影术
材料科学
电子
传输(电信)
能量过滤透射电子显微镜
扫描透射电子显微镜
光学
计算科学
纳米技术
人工智能
物理
电信
量子力学
作者
Yu 宇 Meng 蒙,Shuya 淑雅 Wang 王,Xibiao 锡标 Ren 任,Han 涵 Xue 薛,Xuejun 学军 Yue 岳,Chuanhong 传洪 Jin 金,Shanggang 上港 Lin 林,Fang 芳 Lin 林
标识
DOI:10.1088/1674-1056/ad9ba3
摘要
Abstract High-resolution transmission electron microscopy (HRTEM) promises rapid atomic-scale dynamic structure imaging. Yet, the precision limitations of aberration parameters and the challenge of eliminating aberrations in Cs -corrected transmission electron microscopy constrain resolution. A machine learning algorithm is developed to determine the aberration parameters with higher precision from small, lattice-periodic crystal images. The proposed algorithm is then validated with simulated HRTEM images of graphene and applied to the experimental images of a molybdenum disulfide (MoS 2 ) monolayer with 25 variables (14 aberrations) resolved in wide ranges. Using these measured parameters, the phases of the exit-wave functions are reconstructed for each image in a focal series of MoS 2 monolayers. The images were acquired due to the unexpected movement of the specimen holder. Four-dimensional data extraction reveals time-varying atomic structures and ripple. In particular, the atomic evolution of the sulfur-vacancy point and line defects, as well as the edge structure near the amorphous, is visualized as the resolution has been improved from about 1.75 Å to 0.9 Å. This method can help salvage important transmission electron microscope images and is beneficial for the images obtained from electron microscopes with average stability.
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