发光二极管
材料科学
光电子学
光学
功率(物理)
反射器(摄影)
折射率
二极管
光纤
能量转换效率
光子学
半导体激光器理论
菲涅耳方程
电效率
光功率
全内反射
光强度
分布式布拉格反射镜
电子束光刻
耦合模理论
光纤激光器
抛物面反射器
可见光谱
光通信
反射(计算机编程)
作者
Shilin Liu,Yingmeng Wang,Xiaofang Ye,Sihao Ren (20515411),Li Chen,Wenyu Kang,Wei Jiang,Yaping Wu (817470),Jun Yin,Junyong Kang
摘要
Extremely low light extraction efficiency (LEE) remains a major bottleneck limiting the wall-plug efficiency (WPE) of AlGaN-based deep-ultraviolet (DUV) light-emitting diodes (LEDs). This challenge is particularly pronounced for devices with wavelengths below 250 nm, where strong transverse magnetic (TM) mode emission drives a large fraction of photons to propagate laterally and thus, impedes the light extraction. Here, we demonstrate, to our knowledge, a novel device architecture that combines a distributed array of emitting units with a converging omnidirectional reflector (ODR) to realize efficient LEE in sub-250 nm flip-chip DUV LEDs. This architecture features an ultrathin p-GaN contact layer and an ITO current-spreading layer, which allow the intentionally designed resonant reflective cavity on the p-side to be fully utilized for enhanced axial light output. Simultaneously, a sidewall reflective coating applied on the miniaturized emitting units further facilitates the forward convergence of laterally propagating photons. These combined measures finally achieve comprehensive photon management and result in high LEE for the device. Through optimization of the distributed emitting-unit dimensions, the device attains a WPE of up to 1.67% and a peak light output power of 83.2 mW. Benefiting from the improved LEE, the realized WPE represents a record value within this wavelength range, underscoring the strong application potential of both the proposed chip architecture and the implemented photon-management strategy.
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