极化(电化学)
光电子学
紫外线
光学
多路复用
光子学
材料科学
光通信
相位板
物理
紫外线
可扩展性
光强度
三维光学数据存储
等离子体子
相干控制
光开关
光发射
雷
光学工程
强度调制
作者
Yang Kang,Junxing Qiu,Muhammad Hunain Memon,Huabin Yu,Yuchen Du,李思源 Li Siyuan,Yiguo Yan,Zhixiang Gao,Zeyu Tang,Sheng Liu,Haiding Sun
摘要
ABSTRACT Implementing light polarization control has enabled the realization of numerous fascinating optical phenomena and functionalities in both scientific and industrial applications. However, achieving precise and deterministic manipulation of light polarization in shorter wavelength, e.g., deep ultraviolet (DUV) band (λ < 280 nm) remains challenging. Herein, we demonstrate, for the first time, electrode‐engineered polarization control of DUV emission directly from a light emitter, without involving bulky external optics or complex metasurface or plasmonic architectures. Simply by strategically engineering the p‐type electrode geometry from circular, micro‐ring to narrow‐ring configurations, the relative contributions of transverse‐magnetic (TM) and transverse‐electric (TE) emission can be systematically controlled, yielding well‐separated TM to TE intensity ratios of 0.36, 0.54, and 0.77, respectively. Strikingly, their −3 dB bandwidths are 261, 298, and 300 MHz, respectively, with corresponding high‐speed data rates of 2.49, 2.63, and 2.87 Gbps can be achieved. Building upon this controllable polarization and modulation landscape, we further demonstrate polarization‐assisted multiplexing and physical‐layer secure optical communication by leveraging device‐specific polarization states as intrinsic optical fingerprints. These results establish a feasible and scalable approach toward the direct control over the DUV‐light polarization for high‐speed and secure ultraviolet photonic systems.
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