材料科学
石英玻璃
薄膜
扫描隧道显微镜
衍射
金属
纳米技术
光学
复合材料
冶金
物理
作者
Leonid Lichtenstein,Christin Büchner,Bing Yang,Shamil Shaikhutdinov,Markus Heyde,Marek Sierka,Radosław Włodarczyk,Joachim Sauer,Hans‐Joachim Freund
标识
DOI:10.1002/anie.201107097
摘要
Clear as glass: The atomic structure of a metal-supported vitreous thin silica film was resolved using low-temperature scanning tunneling microscopy (STM). Based on the STM image, a model was constructed and the atomic arrangement of the thin silica glass determined (see picture). The total pair correlation function of the structural model shows good agreement with diffraction experiments performed on vitreous silica.
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