分光计
小型化
材料科学
表征(材料科学)
测距
窄带
可扩展性
纳米技术
钥匙(锁)
可穿戴计算机
计算机科学
足迹
光子学
千分尺
灵活性(工程)
数码产品
职位(财务)
光学
计量学
光电子学
可穿戴技术
仪表(计算机编程)
作者
G Q Zhang,Hao Jiang,Shen Lai,Weijie Zhao,Yang Chen,Hongbing Cai,Qinghai Tan,Weibo Gao
标识
DOI:10.1002/adfm.202529588
摘要
ABSTRACT Spectral analysis is a fundamental tool in science and technology, enabling precise characterization across disciplines ranging from materials science to biomedicine. As applications increasingly demand compact, integrable, and high‐performance optical systems, the miniaturization of spectrometers has become a central challenge. Conventional miniaturized spectrometers, however, are limited by a trade‐off between device footprint and spectral resolution, restricting their scalability to the micrometer scale. Low‐dimensional materials, with their exceptional optical and electronic properties, present new opportunities to overcome these constraints. Here, recent progress in spectrometers based on low‐dimensional materials, highlighting advances in material heterostructures, device architectures, and algorithm‐assisted reconstruction techniques is reviewed. These developments are enabling compact spectrometers that approach or surpass the performance of their larger counterparts. Notably, systems based on low‐dimensional materials offer the ability to extract high‐dimensional optical information, facilitating a transition from conventional narrowband analysis to broadband, multi‐parameter spectral reconstruction. Such capabilities position low‐dimensional material‐based spectrometers at the forefront of next‐generation optical sensing, with broad implications for integrated photonics, wearable systems, and intelligent instrumentation.
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