材料科学
热液循环
锌
纳米-
光电探测器
可见光谱
光电子学
薄膜
纳米技术
化学工程
复合材料
冶金
工程类
作者
Ajeet Gupta,Avneesh Kumar,Surbhi Gahlot,Mudit P. Srivastava,Devendra Kumar Rana
标识
DOI:10.1149/2162-8777/ad6036
摘要
Zinc oxysulfide (ZnOS) nano-thin film has been deposited on a p-type silicon and glass substrate via the hydrothermal deposition method at a temperature of 200 °C. The crystallographic information and morphological analysis of zinc oxysulfide (ZnOS) thin film have been done by X-ray diffraction (XRD) patterns and field effect scanning electron microscopy (FESEM). The chemical composition investigation of the ZnOS thin film was done by energy-dispersive X-ray spectroscopy (EDX). Ultraviolet-visible (UV–vis) and photoluminescence (PL) spectroscopy have been utilized for optical analysis. The electrical and electro-optical measurements of ZnOS thin film have been carried out by I-V characteristics in the visible light environment with a power density of 30 mW cm −2 . It was found that zinc oxysulfide (ZnOS) thin film illustrates the facile responsive photodetection under visible light. The ZnOS thin film has a response time of 1.46 s and a recovery time is equal to 1.32 s. The specific detectivity of the deposited thin film was found to be 3.81 × 10 8 Jones. The responsivity of the deposited thin film is found 7.08 × 10 2 mA W −1 .
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