过氧化氢
废水
化学
水溶液
工业废水处理
降级(电信)
核化学
光催化
污水处理
制浆造纸工业
化学工程
有机化学
催化作用
环境科学
环境工程
工程类
电信
计算机科学
作者
Rui Li,Dinusha Siriwardena,David Speed,Sujan Fernando,Thomas M. Holsen,Selma Mededovic Thagard
标识
DOI:10.1021/acs.iecr.1c00976
摘要
Some semiconductor fabrication processes generate high-strength wastewater that may contain high concentrations of azoles, amines, hydrogen peroxide, organic, and inorganic co-contaminants, making the treatment of this wastewater challenging. In this study, the Fenton process was utilized for the treatment of 53 mM pyrazole and 34 mM 2-(2-aminoethoxy) ethanol (known as diglycolamine, DGA) in a lab-prepared aqueous mixture containing 3.5 M hydrogen peroxide and 16 mM inorganic fluoride. The effects of operational variables for the Fenton process, such as temperature (10, 18, or 25 °C), iron dosing (32.3, 37.3, or 74.5 mM), and pH (2.5, 3.0, or 3.5), on the degradation rates were investigated. The chosen variables were then used to treat wastewater from a semiconductor fabrication facility. The Fenton process was effective in treating both the lab-prepared mixture and semiconductor industrial wastewater. The degradation of pyrazole and DGA yielded a range of byproducts including inorganic ions and organic acids.
科研通智能强力驱动
Strongly Powered by AbleSci AI