表征(材料科学)
散射
衍射
中子散射
同步加速器
中子衍射
同步辐射
中子
领域(数学)
物理
材料科学
光学
小角中子散射
纳米材料
计算物理学
纳米结构
纳米技术
自然(考古学)
核物理学
工程物理
中子源
核工程
X射线晶体学
X射线散射技术
作者
Cédric Gommes,Sebastian Jaksch,Henrich Frielinghaus
标识
DOI:10.1107/s1600576721010293
摘要
Many experimental methods are available for the characterization of nanostructures, but most of them are limited by stringent experimental conditions. When it comes to analysing nanostructures in the bulk or in their natural environment – even as ordinary as water at room temperature – small-angle scattering (SAS) of X-rays or neutrons is often the only option. The rapid worldwide development of synchrotron and neutron facilities over recent decades has opened unprecedented possibilities for using SAS in situ and in a time-resolved way. But, in spite of its huge potential in the field of nanomaterials in general, SAS is covered far less than other characterization methods in non-specialized curricula. Presented here is a rigorous discussion of small-angle scattering, at a technical level comparable to the classical undergraduate coverage of X-ray diffraction by crystals and which contains diffraction as a particular case.
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