过程能力
过程能力指数
过程(计算)
汽车工业
统计
采样(信号处理)
计算机科学
可靠性工程
数学
在制品
工程类
运营管理
电信
探测器
操作系统
航空航天工程
标识
DOI:10.1080/00224065.1986.11978984
摘要
The capability indices Cp, CPU, CPL, k and Cpk are presented and related to process parameters. These indices are shown to form a complementary system of measures of process performance, and can be used with bilateral and unilateral tolerances, with or without target values. A number of Japanese industries currently use the five indices and the U.S. automotive industry has started using these measures in a number of areas. Various applications of the indices are discussed along with statistical sampling considerations.
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