A 3.9 ps Time-Interval RMS Precision Time-to-Digital Converter Using a Dual-Sampling Method in an UltraScale FPGA

Field programmable gate arrays (FPGAs) manufactured with more advanced processing technology have faster carry chains and smaller delay elements, which are favorable for the design of tapped delay line (TDL)-style time-to-digital converters (TDCs) in FPGA. However, new challenges are posed in using them to implement TDCs with a high time precision. In this paper, we propose a bin realignment method and a dual-sampling method for TDC implementation in a Xilinx UltraScale FPGA. The former realigns the disordered time delay taps so that the TDC precision can approach the limit of its delay granularity, while the latter doubles the number of taps in the delay line so that the TDC precision beyond the cell delay limitation can be expected. Two TDC channels were implemented in a Kintex UltraScale FPGA, and the effectiveness of the new methods was evaluated. For fixed time intervals in the range from 0 to 440 ns, the average RMS precision measured by the two TDC channels reaches 5.8 ps using the bin realignment, and it further improves to 3.9 ps by using the dual-sampling method. The time precision has a 5.6% variation in the measured temperature range. Every part of the TDC, including dual-sampling, encoding, and on-line calibration, could run at a 500 MHz clock frequency. The system measurement dead time is only 4 ns.