光探测
光电子学
材料科学
光电探测器
宽带
响应度
分光计
半导体
光谱学
光电二极管
质谱法
光学
数码产品
探测器
异质结
光学滤波器
等离子体子
光子学
分辨率(逻辑)
半导体器件
光放大器
热辐射计
作者
Enzi Chen,Kun Chen,Runze Zhan,Mingkang Zhang,Xi Wan,Xiaoying Wang,Xin Zheng,Shaozhi Deng
出处
期刊:Small
[Wiley]
日期:2026-01-21
卷期号:: e14754-e14754
标识
DOI:10.1002/smll.202514754
摘要
ABSTRACT Controlling carrier polarity in 2D semiconductors is essential for complementary electronics but is hindered by Fermi‐level pinning. Here, we demonstrate contact engineering in 2H‐MoTe 2 using high‐work‐function Pt and low‐work‐function Bi to realize p‐type and n‐type field‐effect transistors. An asymmetric Pt/2H‐MoTe 2 /Bi configuration enables a self‐powered broadband photodetector with a 430–1400 nm response, a maximum responsivity of 1.06 A/W, and a detectivity of 1.86 × 10 12 Jones. The device exhibits fast photoresponse (7.53 µs for rise time and 2.39 µs for fall time) and a cutoff frequency > 50 kHz, allowing real‐time near‐infrared optical communication via ASCII‐encoded binary signals. Integrating the same architecture with computational spectroscopy algorithms yields a miniaturized spectrometer (430–1400 nm), achieving 5 nm spectral resolution at ≤ 1 V drain bias. This unified, low‐power, and high‐speed platform demonstrates broadband spectral reconstruction and color imaging, highlighting the potential of contact‐engineered 2D semiconductors for next‐generation on‐chip spectroscopy and optical communication.
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