电阻随机存取存储器
钽
神经形态工程学
横杆开关
电压
作者
Antonio C. Torrezan,John Paul Strachan,G. Medeiros‐Ribeiro,R. Stanley Williams
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2011-11-09
卷期号:22 (48): 485203-485203
被引量:578
标识
DOI:10.1088/0957-4484/22/48/485203
摘要
We report sub-nanosecond switching of a metal-oxide-metal memristor utilizing a broadband 20 GHz experimental setup developed to observe fast switching dynamics. Set and reset operations were successfully performed in the tantalum oxide memristor using pulses with durations of 105 and 120 ps, respectively. Reproducibility of the sub-nanosecond switching was also confirmed as the device switched over consecutive cycles.
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