Image registration under translation and rotation in two-dimensional planes using Fourier slice theorem

Image recognition in the presence of both rotation and translation is a longstanding problem in correlation pattern recognition. Use of log polar transform gives a solution to this problem, but at a cost of losing the vital phase information from the image. The main objective of this paper is to develop an algorithm based on Fourier slice theorem for measuring the simultaneous rotation and translation of an object in a 2D plane. The algorithm is applicable for any arbitrary object shift for full 180° rotation.