Synergistic effects of total ionizing dose and radiated electromagnetic interference on analog-to-digital converter

The influence of combined total ionization dose (TID) and radiated electromagnetic interference (EMI) in a commercial analog-to-digital converter (ADC) was studied. The degradation of the direct-current response, the static parameters, and the dynamic parameters caused by the TID and EMI separately and synergistically is presented. The experimental results demonstrate that the increase in TID intensifies data error and the signal-to-noise ratio (SNR) degradation caused by radiated EMI. The cumulative distribution function of EMI failure with respect to data error and SNR with different TIDs was extracted. The decreasing trend of the threshold was acquired with a small sample size of five for each TID group. The result indicates that the ADC is more sensitive in a compound radiation environment.