CMOS芯片
材料科学
电子工程
晶体管
电气工程
计算机科学
光电子学
工程类
电压
作者
B. Sell,Seungchan An,Jeffrey L. Armstrong,David F. Bahr,B. Bains,R. Bambery,K. Bang,Dipanjan Basu,S. Bendapudi,D. Bergstrom,R. Bhandavat,S. Bhowmick,Markus J. Buehler,D. Caselli,S. Cekli,V. R. Saran Kumar Chaganti,Ying Chang,K. Chikkadi,T. Chu,Timothy F. Crimmins
出处
期刊:
日期:2022-06-12
卷期号:: 282-283
被引量:38
标识
DOI:10.1109/vlsitechnologyandcir46769.2022.9830194
摘要
A new advanced CMOS FinFET technology, Intel 4, is introduced that extends Moore's law by offering 2X area scaling of the high performance logic library and greater than 20% performance gain at iso-power over Intel 7. The scaled high-performance library offers 50nm gate pitch, 30nm fin pitch and 30nm minimum metal pitch. This node delivers 8VT (4NVT + 4PVT) spanning a range of 190mV/180mV for N/PMOS, enabling designers to choose between power and speed requirements. EUV lithography is used extensively to simplify the process flow and improve yield. The interconnect stack features 16 metal layers with enhanced copper metallurgy at critical lower layers to deliver improved electromigration (EM) and lower line resistance (LR).
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