微束
表征(材料科学)
纳米技术
光学
物理
材料科学
作者
Gene E. Ice,J. D. Budai,Judy Pang
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2011-12-02
卷期号:334 (6060): 1234-1239
被引量:306
标识
DOI:10.1126/science.1202366
摘要
X-ray microbeams are an emerging characterization tool with broad implications for science, ranging from materials structure and dynamics, to geophysics and environmental science, to biophysics and protein crystallography. We describe how submicrometer hard x-ray beams with the ability to penetrate tens to hundreds of micrometers into most materials and with the ability to determine local composition, chemistry, and (crystal) structure can characterize buried sample volumes and small samples in their natural or extreme environments. Beams less than 10 nanometers have already been demonstrated, and the practical limit for hard x-ray beam size, the limit to trace-element sensitivity, and the ultimate limitations associated with near-atomic structure determinations are the subject of ongoing research.
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