单斜晶系
八面体
结晶学
材料科学
晶体结构
粉末衍射
中子衍射
结构精修
X射线
中子
非阻塞I/O
离子
分析化学(期刊)
化学
光学
物理
生物化学
色谱法
催化作用
有机化学
量子力学
作者
Stefan Dick,Michaela Müller,Franziska Preissinger,Thomas Zeiske
出处
期刊:Powder Diffraction
[Cambridge University Press]
日期:1997-12-01
卷期号:12 (4): 239-241
被引量:29
标识
DOI:10.1017/s0885715600009805
摘要
The crystal structure of low temperature NaNiO 2 has been refined by Rietveld methods using powder X-ray diffraction and neutron scattering data. The starting model was based on parameters that had been obtained earlier by X-ray film methods. At room temperature NaNiO 2 is monoclinic, C 2/ m , a =0.53192(2), b =0.28451(1), c =0.55826(4) nm, β=110.449(2)°. NaNiO 2 has a layered structure. The Ni–O layer is formed by edge sharing of Jahn–Teller elonganted NiO 6 octahedra with Ni–O distances of 0.1911(2) nm and 0.2144(4) nm. The Na ions between these layers also exhibit a distorted octahedral coordination with Na–O distances of 0.2328(2) nm and 0.2369(4) nm. The final R values were R wp =0.069, R I =0.059, R exp =0.059 for the neutron and R wp =0.032, R I =0.034, R exp =0.017 for the X-ray data.
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