五氧化二铁
纳米线
材料科学
钒
纤维
纳米技术
电阻率和电导率
沉积(地质)
扫描电子显微镜
电导率
化学工程
复合材料
电气工程
物理化学
冶金
古生物学
工程类
化学
生物
沉积物
作者
J. Muster,G. T. Kim,Vojislav Krstić,Jin Gyu Park,Y. W. Park,S. Roth,Marko Burghard
标识
DOI:10.1002/(sici)1521-4095(200003)12:6<420::aid-adma420>3.0.co;2-7
摘要
The controlled deposition of individual V2O5 nanowires on chemically modified SiO2 substrates is reported here. Electrical transport measurements were performed on individual fibers (see Figure) and on thin fiber networks, and the conductivity of an individual V2O5 nanowire was estimated to be ∼0.5 S/cm at room temperature. The structure of the fibers was investigated using scanning force microscopy.
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