钎焊
互连
放热反应
引线键合
可靠性(半导体)
焊接
材料科学
数码产品
散热片
基质(水族馆)
电子包装
工程物理
机械工程
纳米技术
电气工程
合金
工程类
功率(物理)
化学
计算机科学
复合材料
炸薯条
电信
地质学
物理
有机化学
海洋学
量子力学
作者
Canyu Liu,Allan Liu,Han Jiang,Shuibao Liang,Zhaoxia Zhou,Changqing Liu
标识
DOI:10.1016/j.microrel.2022.114688
摘要
For the high-power modules packaging, Cu clip bonding has gained growing interest to replace the multiple wire-bonding for the benefits of lower resistance and improved thermal performance, which is especially beneficial for higher reliability. However, the current interconnection materials and bonding processes cannot fully meet the reliability requirements of the emerging Cu clip integrated structure. Brazing alloys can serve in high-temperature conditions, since they have the melting points above 450 °C. However, very limited brazing alloys have been applied in electronics packaging since the processing temperature is also high if needs to be melted. It is promising to develop the low-temperature bonding technology which can serve at high temperatures. In this study, incorporating with the Cu-15Ag-5P brazing alloy as the interconnection material, the self-propagating exothermic reaction (SPER) has been applied to assist the Cu clip bonding process, which provides intense local heating to achieve the interconnects in millisecond scale. The bonding mechanism between Cu-15Ag-5P and Cu substrate is examined and discussed. The research findings promise an effective assembly route viable for the application of high-power electronics packaging.
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