Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

Bulk electronic structure of novel layered superconductor Nd(O,F)BiS 2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS 2 and La(O,F)BiS 2 , we discuss possible important factors for the superconductivity in this series of material.