聚乙烯吡咯烷酮
材料科学
二硫化钨
记忆电阻器
波段图
纳米复合材料
单层
纳米技术
电导
化学工程
光电子学
复合材料
电气工程
凝聚态物理
高分子化学
带隙
工程类
物理
作者
Qing Cao,Limiao Xiong,Xudong Yuan,Pengcheng Li,Jun Wu,Hailin Bi,Jun Zhang
摘要
Ag/tungsten disulfide (WS2)–polyvinylpyrrolidone (PVP)/Cu memristors based on monolayer WS2 nanosheets and polyvinylpyrrolidone (PVP) nanocomposites were fabricated, and the influence of PVP content on the switching behaviors was investigated. The results indicate that the WS2–PVP based memristors show write-once read-many times (WORM) memory behavior. Remarkable resistive switching results such as a low operating voltage (VSET < 1 V), a high switching ratio (>103), good endurance (>100 cycles), and data retention time (>200 s) are obtained. With the increase in the PVP content, the device VSET gradually increases, and the switching ratio first slightly increases and then remarkably decreases. The double logarithm I–V curves verify that the switching mechanism of the devices is the trap-controlled space charge limited current mechanism, which is explained with the energy band diagram.
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