材料科学
折射率
薄膜
溅射
光学涂层
光电子学
激光器
激光束
光学
纳米技术
物理
作者
Kuo‐Jui Hsiao,J. M. Blanco Rodriguez,J. T. Jensen,D. Patel,D. Alessi,E. Granados,Y. Wang,J. J. Rocca,Carmen S. Menoni,Peter Langston,Albert Ogloza
标识
DOI:10.1364/fio.2007.jwc3
摘要
The influence of process conditions on the loss, refractive index, and laser induced damage threshold (LIDT) of HfO2/SiO2 thin films grown by ion beam assisted sputtering is investigated to realize films with losses less than 20 ppm.
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