Molecular design of polyimide films for combating atomic oxygen erosion through combing experiments with simulations: A state-of-the-art review

聚酰亚胺 材料科学 聚合物 航空航天 纳米技术 近地轨道 原子层沉积 航空航天工程 机械工程 工程物理 物理 复合材料 薄膜 图层(电子) 工程类 卫星
作者
Yanwei Gong,Hao Tian,Bo Niu,Yue Xing,Xiubing Liang,Yayun Zhang,Donghui Long
出处
期刊:Polymer Degradation and Stability [Elsevier BV]
卷期号:220: 110645-110645 被引量:10
标识
DOI:10.1016/j.polymdegradstab.2023.110645
摘要

Atomic oxygen (AO), as the primary component in the low Earth orbit (LEO), poses significant hazards to polymer materials. Polyimide, due to its excellent dielectric properties, mechanical strength, thermal stability, and radiation resistance, has become an ideal space polymer material widely used in LEO applications, which is prone to erosion caused by AO. To address this issue, various strategies have been employed to enhance PI's resistance against AO. Previous reviews on AO-resistant PI have primarily concentrated on experimental preparation methods, with relatively little emphasis on theoretical calculations and erosion mechanism. This review summarizes the research progress of both experiments and theoretical calculations on AO-resistant PI materials, with a specific focus on elucidating the rationale behind material design. Firstly, we introduce commonly used commercial PI films in the aerospace field. Secondly, we review experimental methods aimed at improving PI's ability to resist atomic oxygen, including protective coatings, blending and intrinsic modification approaches. Furthermore, our focus extends towards theoretical calculations of AO-resistant PI films, analyzing the underlying principles and mechanisms governing PI's capability to withstand atomic oxygen erosion. Finally, we present an extensive evaluation of different methods to enhance PI's resistance against AO and provide valuable suggestions and prospects for future developments in AO-resistant PI materials.
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