可制造性设计
光掩模
计算机科学
正规化(语言学)
反向
光学接近校正
反问题
平版印刷术
人工智能
材料科学
光电子学
纳米技术
机械工程
数学
图层(电子)
几何学
数学分析
工程类
抵抗
作者
Ningning Jia,Alfred K. K. Wong,Edmund Y. Lam
摘要
Mask manufacturability has been considered as a major issue in the adoption of inverse lithography (IL) in practice.With smaller technology nodes, IL distorts the mask pattern more aggressively.The distorted mask often contains curvilinear contour and irregular shapes, which cast a heavy computation burden on segmentation and data preparation.Total variation (TV) has been used for regularization in previous work, but it is not very effective in regulating the mask shape to be rectangular.In this paper, we apply TV regularization not only on the mask image but also on the mask edges, which forces the curves of edges to be more vertical or horizontal, because they give smaller TV values.Except for rectilinearity, a group of geometrical specifications of the mask pattern set by mask manufacture rule control (MRC) is also important for mask manufacturability.To prevent these characteristics from appearing, we also propose an intervention scheme into the optimization framework.
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