薄膜晶体管
材料科学
光电子学
外延
脉冲激光沉积
电子迁移率
氧化物
氧化钇稳定氧化锆
氧化锡
晶体管
薄膜
立方氧化锆
纳米技术
图层(电子)
电压
兴奋剂
电气工程
冶金
陶瓷
工程类
作者
Yoichi Ogo,Hidenori Hiramatsu,Kenji Nomura,Hiroshi Yanagi,Toshio Kamiya,Masahiro Hirano,Hideo Hosono
摘要
This paper reports that among known p-type oxide semiconductors, tin monoxide (SnO) has a high hole mobility and produces good p-type oxide thin-film transistors (TFTs). Device-quality SnO films were grown epitaxially on (001) yttria-stabilized zirconia substrates at 575°C by pulsed laser deposition. These exhibited a Hall mobility of 2.4cm2V−1s−1 at room temperature. Top-gated TFTs, using epitaxial SnO channels, exhibited field-effect mobilities of 1.3cm2V−1s−1, on/off current ratios of ∼102, and threshold voltages of 4.8V.
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