材料科学
半值层
电磁屏蔽
质量衰减系数
平均自由程
衰减系数
衰减
辐射
有效原子序数
辐射屏蔽
分析化学(期刊)
差示扫描量热法
光学
复合材料
热力学
物理
色谱法
散射
化学
作者
Shiyu Yin,Zhizhi Zhang,Xiang Yu,Qianqian Qiao,Guanzhou Ding,Xianchao Huang,Qiuhan Lin
摘要
Abstract This paper studied the radiation shielding properties of new lead‐free telluride glass with different BaF 2 content. The 65TeO 2 –15Bi 2 O 3 –(20 − x )ZnO– x BaF 2 glass systems (where x = 1, 3, 5, 7, 9 mol%) were tested through the X‐ray diffraction, ultraviolet–visible spectrophotometer, and differential scanning calorimetry. The glass system exhibited good thermal stability and a uniform surface without surface crystallization. The linear attenuation coefficient of the TBZBF series glass was tested using five different gamma radiation sources ( 241 Am, 133 Ba, 57 Co, 137 Cs, and 60 Co). They were calculated to the mass attenuation coefficient, half‐value layer, mean free path, and effective atomic number through numerical simulations with XCOM software. The maximum mass attenuation coefficient for TBZBF‐9 was calculated to be 5.3577 cm 2 /g. Comparisons were made between this glass system and other tellurite and leaded glasses reported in the literature. The glass system exhibited superior radiation shielding capability compared to leaded tellurite glass under the same testing conditions. The gamma radiation shielding capacity increased with BaF 2 content in the glass system. These results show that TBZBF‐9 exhibited the best gamma radiation shielding effectiveness while maintaining glass transparency.
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