串扰
电压
电感
MOSFET
电阻式触摸屏
解耦(概率)
电子工程
材料科学
计算机科学
电气工程
工程类
晶体管
控制工程
作者
Hao Xu,Yumeng Cai,Peng Sun,Zhibin Zhao,Boyuan Cao
出处
期刊:Iet Power Electronics
[Institution of Engineering and Technology]
日期:2023-07-16
卷期号:16 (14): 2356-2368
被引量:1
摘要
Abstract Due to the higher switching speed and lower threshold voltage of SiC MOSFET, its crosstalk issue is more serious than that of Si devices. Firstly, the mechanism and process of crosstalk under resistive load and inductive load are compared and analyzed. Then, a parameter decoupling method based on energy conservation is proposed, and an analytical model of the crosstalk voltage under resistive load is established. Moreover, an analytical model of the crosstalk voltage under inductive load with only device and circuit parameters is introduced. Furthermore, the influence of the drive resistance and the common source inductance on the crosstalk voltage under different loads is evaluated through the analytical model. Finally, a double pulse test is carried out to verify the validity of the analysis. The results presented here can provide guidance for the design of gate circuit parameters to regulate the crosstalk issue of SiC MOSFETs under different loads.
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