纳米尺度
光电子学
材料科学
CMOS芯片
集成光学
纳米技术
标识
DOI:10.1364/cleo_si.2024.sm2l.7
摘要
Optical metasurfaces can be utilized to manipulate light properties in ultra-thin layers. We present recent results on integrating metallic and dielectric metasurfaces with optoelectronic devices for refractive index sensing and wavelength-selective photodetection.
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