空位缺陷
带材弯曲
扫描隧道显微镜
硫族元素
掺杂剂
扫描隧道光谱
材料科学
带隙
电离
光谱学
Atom(片上系统)
量子隧道
电离能
分子物理学
结晶学
化学
纳米技术
光电子学
物理
兴奋剂
离子
嵌入式系统
有机化学
量子力学
计算机科学
作者
Iolanda Di Bernardo,James Blyth,Liam Watson,Kaijian Xing,Yi‐Hsun Chen,Shao‐Yu Chen,Mark T. Edmonds,Michael S. Fuhrer
标识
DOI:10.1088/1361-648x/ac4f1d
摘要
Chalcogen vacancies in transition metal dichalcogenides are widely acknowledged as both donor dopants and as a source of disorder. The electronic structure of sulphur vacancies in MoS2however is still controversial, with discrepancies in the literature pertaining to the origin of the in-gap features observed via scanning tunneling spectroscopy (STS) on single sulphur vacancies. Here we use a combination of scanning tunnelling microscopy and STS to study embedded sulphur vacancies in bulk MoS2crystals. We observe spectroscopic features dispersing in real space and in energy, which we interpret as tip position- and bias-dependent ionization of the sulphur vacancy donor due to tip induced band bending. The observations indicate that care must be taken in interpreting defect spectra as reflecting in-gap density of states, and may explain discrepancies in the literature.
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