Analysis Through X‐Ray Diffraction of Polycrystalline Thin Films

This chapter contains sections titled: Introduction Some reminders of x-ray diffraction and crystallography Application to powder or polycrystalline thin-films Phase analysis by X-ray diffraction Identification of coherent domain sizes of diffraction and micro-strains Identification of crystallographic textures by X-ray diffraction Determination of strains/stresses by X-ray diffraction Bibliography