铁电性
脉冲激光沉积
材料科学
电介质
扫描电子显微镜
极化(电化学)
形态学(生物学)
基质(水族馆)
衍射
薄膜
结晶学
光电子学
光学
纳米技术
化学
复合材料
物理
地质学
物理化学
海洋学
生物
遗传学
作者
Seiji Yamazoe,H. Sakuraï,Masaki Fukada,Hideaki Adachi,Takahiro Wada
摘要
Orientated NaNbO3 (NN) films were grown on SrRuO3/(001)SrTiO3 [SRO/(001)STO], SRO/(110)STO, and SRO/(111)STO substrates by pulsed laser deposition. Scanning electron microscopy images showed that the surface morphologies of the NN/SRO/(001)STO, NN/SRO/(110)STO, and NN/SRO/(111)STO took the form of a stepped structure, a striped pattern, and trigonal pyramidal-like structures, respectively. The dielectric and ferroelectric properties of the films were characterized. The NN/SRO/(110)STO film showed the lowest relative dielectric constant and the largest remanent polarization of 30.8 μC/cm2 among all films. These were interpreted as being due to the orientation direction of the NN film grown on (110)STO being parallel to the polarization direction of NN.
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