Thermal resistance and temperature distribution in blue and white high-power LED arrays

Thermal resistance and temperature distribution for high-power AlGaInN LED chip-on-board arrays in blue and white versions were measured by different methods and tools. The p-n junction temperature was determined through measuring a temperature-dependent forward voltage drop on the p-n junction, at a low measuring current after applying a high heating current. Furthermore, the infrared thermal imaging technique was employed to obtain the temperature map for the test object. A steady-state 3D computational model of the experimental setup was created including temperature-dependent power dissipation in the LED chips and partitioned interfacial thermal resistance between the heatsink and the LED array. Simulations of the heat transfer in the LED array were performed to further investigate temperature gradients observed in the measurements.