二硫化钼
材料科学
结晶度
图层(电子)
晶体管
光电子学
氧化物
钼
场效应晶体管
平面的
薄膜晶体管
氧化钼
纳米技术
氧气
原子层沉积
化学工程
二硫键
等效氧化层厚度
电子迁移率
作者
Yu-Han Huang,Hao-Yu Wang,Po-Tsung Lee,Shih‐Yen Lin
标识
DOI:10.35848/1347-4065/ae4039
摘要
Abstract Bi-layer molybdenum disulfide (MoS 2 ) films were prepared through sequential mono-layer MoS 2 growth using high temperature sulfurization of Mo oxide layers deposited by using the atomic layer deposition. An oxygen plasma treatment on the first MoS 2 layer will improve precursor distribution during the subsequent Mo oxide deposition, leading to a smoother second MoS 2 layer growth. Through the multi-stage sulfurization to enhance planar MoS 2 growth and depress Mo oxide segregation, uniform bi-layer MoS 2 films with improved crystallinity can be obtained. The bi-layer MoS 2 transistors exhibited a 42 times enhancement in field effect mobility compared with the mono-layer device. The sequential growth of mono-layer MoS 2 to achieve wafer-scale and bi-layer MoS 2 films provides a promising route for optimizing transistor performance toward practical applications.
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