阈下斜率
材料科学
石墨烯
缩放比例
晶体管
电介质
联轴节(管道)
光电子学
堆栈(抽象数据类型)
栅极电介质
凝聚态物理
纳米技术
MOSFET
物理
量子力学
复合材料
电压
计算机科学
几何学
程序设计语言
数学
作者
Parameswari Raju,Hao Zhu,Yafen Yang,Kai Zhang,Dimitris E. Ioannou,Qiliang Li
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2022-11-01
卷期号:34 (5): 055001-055001
被引量:2
标识
DOI:10.1088/1361-6528/ac9e5e
摘要
Abstract As down scaling of transistors continues, there is a growing interest in developing steep-slope transistors with reduced subthreshold slope (SS) below the Boltzmann limit. In this work, we successfully fabricated steep-slope MoS 2 transistors by incorporating a graphene layer, inserted in the gate stack. For our comprehensive study, we have applied density functional theory to simulate and calculate the change of SS effected by different 2D quantum materials, including graphene, germanene and 2D topological insulators, inserted within the gate dielectric. This theoretical study showed that graphene/MoS 2 devices had steep SS (27.2 mV/decade), validating our experimental approach (49.2 mV/decade). Furthermore, the simulations demonstrated very steep SS (8.6 mV/decade) in WTe 2 /MoS 2 devices. We conclude that appropriate combination of various 2D quantum materials for the gate-channel stacks, leads to steep SS and is an effective method to extend the scaling of transistors with exceptional performance.
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