A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components

In this study, a high-sensitivity composite probe capable of simultaneously measuring electric- and magnetic-field components is presented. The composite probe contains a U-shaped loop, two parasitic long loops, and a pair of strip-lines as a transmission part. First, the U-shaped loop is designed to test both electric- and magnetic-field. Second, two parasitic long loops are placed at both sides of the U-shaped loop to increase the sensitivity. Third, to characterize and calibrate the probe, a standard microstrip line is manufactured and used. Finally, the proposed probe is printed and tested to prove the feasibility of the design. The tested results indicate that the proposed probe can not only simultaneously test electric- and magnetic-fields, but also have a wider working bandwidth and higher sensitivity