材料科学
可伸缩电子设备
纳米技术
数码产品
稳健性(进化)
聚合物
断裂(地质)
可穿戴技术
可靠性(半导体)
断裂力学
柔性电子器件
可穿戴计算机
航空航天
仿生学
复合材料
机械工程
表征(材料科学)
共轭体系
航空航天材料
机械故障
机械强度
开裂
工作(物理)
增韧
纳米复合材料
断裂韧性
结构材料
转印
材料失效理论
材料设计
作者
Bei Li,Jintao Feng,Bing Sun,Wenchao Zhao,Matisakov Tugolbay,Xuechen Jiao,Long Ye
标识
DOI:10.1002/adfm.202532099
摘要
ABSTRACT The rapid advancement of stretchable electronics has established conjugated polymers (CPs) as a cornerstone material class. However, the widespread adoption of CP‐based devices is critically limited by mechanical failure through cracking and fracture, which compromises long‐term operational reliability and functional integrity. This feature‐article bridges the critical gap between high performance and mechanical robustness by providing a systematic, multi‐scale examination of CP fracture behavior. We first consolidate advanced experimental methodologies for quantifying key mechanical metrics including fracture strain, fracture energy, and crack propagation dynamics in ultra‐thin films. The discussion then elucidates the governing factors of fracture resistance across length scales, from molecular architecture, such as backbone rigidity, molecular weight, and side‐chain, to macroscopic parameters like thickness, substrate, and environmental exposure. Subsequently, clear structure‐property relationships are established that dictate mechanical durability, with specific consideration given to neat CPs and complex polymer blend systems used in organic photovoltaics/photodetectors and light‐emitting diodes. Finally, the review outlines forward‐looking strategies to accelerate the development of fracture‐resistant CPs, emphasizing the need for standardized testing protocols, multi‐scale computational modeling, and morphology‐aware material design. This work aims to serve as a foundational guide for transitioning stretchable CPs from promising laboratory materials into reliable, high‐performance components for next‐generation wearable electronics.
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