膜
欧姆接触
电解质
钝化
材料科学
化学工程
催化作用
降级(电信)
氧化物
针孔(光学)
化学
图层(电子)
复合材料
电极
冶金
有机化学
物理化学
工程类
物理
光学
电信
计算机科学
生物化学
作者
Thanh Thien Phan,Sang-Kyung Kim,Jahowa Islam,MinJoong Kim,Jaehun Lee
标识
DOI:10.1016/j.ijhydene.2023.09.274
摘要
A constant current density of 3.0 A/cm2 was applied to PEMWE assembled with three commercial Nafion membranes (NR212, N115, and N117) for 144 h to investigate the influence of membrane thickness on the cell durability. The results show that N115-cell exhibits an improvement in performance after 144 h by the decrease of ohmic resistance caused by the topology adaptation. The cells with NR212 and N117 showed voltage increases, and the most significant degradation could be observed in the NR212-cell. The highest exposing potential of N117-cell accelerated the passivation of the porous transport layer (PTL) and the catalyst dissolution, consequently increasing ohmic losses and kinetic losses. The remarkable performance losses of the NR212 originated from severe ohmic degradation. This phenomenon was attributed to the pinhole formation on the membrane and the resulting decrease in the electrical conductivity of the iridium catalyst layer due to the reduction of iridium oxide catalyst.
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